A Design-Based Structural Test Method for a Switched-Resistor DAC

Lei Ma; Geert Seuren; Robert van Rijsinge; Corné Bastiaansen; Leon van der Dussen

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A Design-Based Structural Test Method for a Switched-Resistor DAC

机译：基于设计的开关电阻DAC结构测试方法

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摘要

In this paper, a design-based structural testing method is presented to enable a fast, low cost test for a switched-resistor digital-to-analogue converter (DAC). A 24-bit stereo DAC is used to demonstrate this. After schematic-level simulations and experimental verification, it is found that the dynamic parameter THD can be predicted by the static test. Practical production wafer test and final test results evaluate this structural test method by comparing it with the traditional THD test method. In this paper the simulation results, the relevant measurement results, and the testing results are discussed. Finally, the application recommendations are given.

机译：在本文中，提出了一种基于设计的结构测试方法，以实现对开关电阻器数模转换器（DAC）的快速，低成本测试。 24位立体声DAC用于演示这一点。经过原理图仿真和实验验证，发现动态参数THD可以通过静态测试进行预测。实际生产的晶圆测试和最终测试结果通过与传统的THD测试方法进行比较来评估这种结构测试方法。本文讨论了仿真结果，相关的测量结果和测试结果。最后，给出了应用建议。

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来源
《Journal of Electronic Testing》 |2007年第6期|559-567|共9页
作者
Lei Ma; Geert Seuren; Robert van Rijsinge; Corné Bastiaansen; Leon van der Dussen;
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作者单位

Philips Semiconductors IC Manufacturing Operations–Test Innovation Centre Gerstweg 2 6534 AE Nijmegen The Netherlands;

Philips Semiconductors Chief Technology Office–Process Library Technology Prof. Holstlaan 4 5656 AA Eindhoven The Netherlands;

Philips Semiconductors IC Manufacturing Operations–Test Innovation Centre Gerstweg 2 6534 AE Nijmegen The Netherlands;

Philips Semiconductors Chief Technology Office–Process Library Technology Prof. Holstlaan 4 5656 AA Eindhoven The Netherlands;

Philips Semiconductors Chief Technology Office–Process Library Technology Prof. Holstlaan 4 5656 AA Eindhoven The Netherlands;

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原文格式 PDF
正文语种 eng
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关键词
Switched-resistor DAC; Design-based structural test; Static test; THD; Test time reduction;

机译：开关电阻DAC;基于设计的结构测试;静态测试;THD;减少测试时间;

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1. A Design-Based Structural Test Method for a Switched-Resistor DAC [J] . Lei Ma, Geert Seuren, Robert van Rijsinge, Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2007,第6期

机译：基于设计的开关电阻DAC结构测试方法
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A Design-Based Structural Test Method for a Switched-Resistor DAC

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