Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment

Teuvo Saikkonen; Markku Moilanen

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Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment

机译：在IEEE 1149.4环境中进行测量的分量值计算和表征

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This paper describes a measurement principle for calculating component values from measurements conducted under less than optimal conditions, as is the case in the IEEE Std 1149.4 environment. Also presented are equations that take into account switch resistances on the signal paths, the output resistance of the signal generator, and the loading effect caused by the input impedance of the voltmeter together with the pin capacitances in parallel to the voltmeter. In addition, the paper presents characterization methods to determine values for these impedances. The inaccuracies achieved in the impedance range from kΩ to MΩ are of the order of few percent.

机译：本文介绍了一种测量原理，用于根据在非最佳条件下进行的测量来计算分量值，就像IEEE Std 1149.4环境中的情况一样。还提出了方程，其中考虑了信号路径上的开关电阻，信号发生器的输出电阻以及电压表的输入阻抗以及与电压表并联的引脚电容引起的负载效应。此外，本文提出了表征方法，以确定这些阻抗的值。在从kΩ到MΩ的阻抗范围内获得的误差约为百分之几。

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来源
《Journal of Electronic Testing》 |2007年第6期|569-579|共11页
作者
Teuvo Saikkonen; Markku Moilanen;
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作者单位

Department of Electrical and Information Engineering University of Oulu P.O. Box 4500 90014 Oulun yliopisto Finland;

Department of Electrical and Information Engineering University of Oulu P.O. Box 4500 90014 Oulun yliopisto Finland;

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原文格式 PDF
正文语种 eng
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关键词
IEEE 1149.4; Mixed-signal test; Loading effect;

机译：IEEE 1149.4;混合信号测试;负载效果;

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1. Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment [J] . Teuvo Saikkonen, Markku Moilanen Journal of Electronic Testing: Theory and Applications: Theory and Applications . 2007,第6期

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Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment

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