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首页> 外文期刊>Journal of Electronic Testing >Methods of Testing Discrete Semiconductors in the 1149.4 Environment
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Methods of Testing Discrete Semiconductors in the 1149.4 Environment

机译：在1149.4环境中测试分立半导体的方法

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摘要

This paper describes measurement methods for testing discrete semiconductors in the environment defined by the IEEE 1149.4 standard for a mixed-signal bus. First, the paper introduces and illustrates measurement procedures for obtaining such essential electrical parameters of diodes and transistors as can be used for testing and identification. Then, the procedures are carried out and the achieved measurement results presented. To demonstrate the usability of the measurement procedures, the paper then presents test methods and measurement results for discrete component blocks. The results indicate that testing and measuring some of the electrical parameters of discrete semiconductors is possible in the 1149.4 environment. These parameters allow the determination of whether the component under test is working properly or not. Our tests only covered the semiconductors’ DC features, disregarding their AC features. Also discussed are limitations of the 1149.4 environment in discrete semiconductor testing.
机译：本文介绍了在混合信号总线的IEEE 1149.4标准定义的环境中测试分立半导体的测量方法。首先，本文介绍并说明了用于获得可用于测试和识别的二极管和晶体管基本电气参数的测量程序。然后，执行程序并显示获得的测量结果。为了证明测量程序的可用性，本文随后介绍了离散组件模块的测试方法和测量结果。结果表明，在1149.4环境中可以测试和测量分立半导体的某些电参数。这些参数可以确定被测组件是否正常工作。我们的测试仅涵盖了半导体的直流特性，而无视其交流特性。还讨论了离散半导体测试中1149.4环境的局限性。

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