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首页> 外文期刊>Journal of Electronic Testing >A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology
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A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology

机译：化学组装电子纳米技术的内置自检和诊断策略

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Chemically assembled electronic nanotechnology (CAEN) is under intense investigation as a possible alternative or complement to CMOS-based computing. CAEN is a form of molecular electronics that uses directed self-assembly and self-alignment to construct electronic circuits from nanometer-scale devices that exploit quantum-mechanical effects. Although expected to have densities greater than 108 gate-equivalents/cm2, CAEN-based systems may possibly exhibit defect densities of up to 10%. The highly defective CAEN circuits will therefore require a completely new approach to manufacturing computational devices. In order to achieve any level of significant yield, it will no longer be possible to discard a device once a defect is found. Instead, a method of using defective chips must be devised. A testing strategy is developed for chemically assembled electronic nanotechnology (CAEN) that takes advantage of reconfigurability to achieve 100% fault coverage and nearly 100% diagnostic accuracy. This strategy is particularly suited for regular architectures with high defect densities.
机译：化学组装的电子纳米技术（CAEN）正在作为基于CMOS的计算的可能替代方案或补充而受到广泛研究。 CAEN是分子电子学的一种形式，它使用定向的自组装和自对准来从利用量子力学效应的纳米级设备构建电子电路。尽管基于CAEN的系统预计密度将大于108 门当量/ cm2 ，但其缺陷密度可能高达10％。因此，高度缺陷的CAEN电路将需要一种全新的方法来制造计算设备。为了达到任何水平的显着良率，一旦发现缺陷，将不再有可能丢弃器件。相反，必须设计一种使用有缺陷的芯片的方法。针对化学组装电子纳米技术（CAEN）开发了一种测试策略，该策略利用可重新配置的功能实现100％的故障覆盖率和近100％的诊断准确性。此策略特别适合具有高缺陷密度的常规体系结构。

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