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首页> 外文期刊>Journal of Engineering for Gas Turbines and Power >Modeling Wall Film Formation and Breakup Using an Integrated Interface-Tracking/Discrete-Phase Approach
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Modeling Wall Film Formation and Breakup Using an Integrated Interface-Tracking/Discrete-Phase Approach

机译:使用集成的界面跟踪/离散相方法对壁膜形成和破裂进行建模

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We propose a computationally tractable model for film formation and breakup based on data from experiments and direct numerical simulations. This work is a natural continuation of previous studies where primary atomization was modeled based on local flow information from a relatively low-resolution tracking of the liquid interface [Arienti and Soteriou, 2007, "Dynamics of Pulsed Jet in Crossflow," ASME Paper No. GT2007-27816]. The submodels for film formation proposed here are supported by direct numerical simulations obtained with the refined level set grid method [Herrmann, 2008, "A Balanced Force Refined Level Set Grid Method for Two-Phase Flows on Unstructured Flow Solver Grids," J. Comput. Phys., 227, pp. 2674-2706]. The overall approach is validated by a carefully designed experiment [Shedd et al., 2009, "Liquid Jet Breakup by an Impinging Air Jet," Forty-Seventh AIAA Aerospace Sciences Meeting. Paper No. AIAA-2009-0998], where the liquid jet is crossflow-atomized in a rectangular channel so that a film forms on the wall opposite to the injection orifice. The film eventually breaks up at the downstream exit of the channel. Comparisons with phase Doppler particle analyzer data and with nonintrusive film thickness point measurements complete this study.
机译:我们基于来自实验和直接数值模拟的数据,提出了一种易于计算的膜形成和破裂模型。这项工作是先前研究的自然延续,在该研究中,基于来自相对较低分辨率的液体界面跟踪的局部流量信息对一次雾化进行了建模[Arienti和Soteriou,2007年,“横流中的脉冲射流动力学”,ASME论文编号: GT2007-27816]。此处提出的用于成膜的子模型得到了通过精制水平集网格方法获得的直接数值模拟的支持[Herrmann,2008,“非结构化流动求解器网格上两相流的平衡力精制水平集网格方法”,J。Comput 。 Phys。,227,第2674-2706页]。整个方法通过精心设计的实验得到验证[Shedd等,2009,“撞击式喷气机造成液体喷气机破裂”,第四十七届AIAA航空航天科学会议。 AIAA-2009-0998号文件],其中在矩形通道中以交叉流雾化液体射流,以便在与喷孔相对的壁上形成薄膜。薄膜最终在通道的下游出口破裂。与相位多普勒粒子分析仪数据和非侵入性薄膜厚度点测量结果的比较完成了这项研究。

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    United Technologies Research Center,411 Silver Lane,East Hartford, CT 06108;

    United Technologies Research Center,411 Silver Lane,East Hartford, CT 06108;

    United Technologies Research Center,411 Silver Lane,East Hartford, CT 06108;

    United Technologies Research Center,411 Silver Lane,East Hartford, CT 06108;

    United Technologies Research Center,411 Silver Lane,East Hartford, CT 06108;

    University of Wisconsin,Madison, Wl 53706;

    Arizona State University,Tempe, AZ 85287;

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