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Ultra-Low Thermal Conductivity in Nanoscale Layered Oxides

机译：纳米层状氧化物中的超低导热系数

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摘要

The cross-plane thermal conductivity of several nanoscale layered oxides SiO_2/Y_2O_3, SiO_2/Cr_2O_3, and SiO_2/Al_2O_3, synthesized by e-beam evaporation was measured in the range from 30 K to 300 K by the 3ω method. Thermal conductivity attains values around 0.5 W/m K at room temperature in multilayer samples, formed by 20 bilayers of 10 nm SiO_2/10 nm Y_2O_3, and as low as 0.16 W/m K for a single bilayer. The reduction in thermal conductivity is related to the high interface density, which produces a strong barrier to heat transfer rather than to the changes of the intrinsic thermal conductivity due to the nanometer thickness of the layers. We show that the influence of the first few interfaces on the overall thermal resistance is higher than the subsequent ones. Annealing the multilayered samples to 1100℃ slightly increases the thermal conductivity due to changes in the microstructure. These results suggest a route to obtain suitable thermal barrier coatings for high temperature applications.
机译：通过3束法在30 K至300 K范围内测量了通过电子束蒸发合成的几种纳米层状氧化物SiO_2 / Y_2O_3，SiO_2 / Cr_2O_3和SiO_2 / Al_2O_3的横截面热导率。在多层样品中，由20个10 nm SiO_2 / 10 nm Y_2O_3双层形成的多层样品在室温下的热导率值约为0.5 W / m K，对于单个双层，其热导率低至0.16 W / mK。热导率的降低与高界面密度有关，高界面密度对传热产生了强大的障碍，而不是由于层的纳米厚度而引起的固有热导率的变化。我们表明，前几个界面对整体热阻的影响高于后续界面。由于显微组织的变化，将多层样品退火至1100℃会稍微增加导热率。这些结果表明获得高温应用合适的热障涂层的途径。

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  • 来源
    《Journal of Heat Transfer》 |2010年第3期|032402.1-032402.6|共6页
  • 作者

    J. Alvarez-Quintana; LI. Peralba-Garcia; J. L. Labar; J. Rodriguez-Viejo;

  • 作者单位

    Department of Physics, Nanomaterials and Microsystems Group, Universitat Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Department of Physics, Nanomaterials and Microsystems Group, Universitat Autonoma de Barcelona, 08193 Bellaterra, Spain;

    Research Institute for Technical Physics and Materials Science, P.O. Box 49, Budapest 114 H-1525, Hungary;

    Department of Physics, Nanomaterials and Microsystems Group, Universitat Autonoma de Barcelona, 08193 Bellaterra, Spain MATGAS Research Center, Campus Universitat Autonoma de Barcelona, 08193 Bellaterra, Spain;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    dielectric oxides; ultra-low thermal conductivity; multilayers;

    机译：介电氧化物超低导热系数;多层;

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