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首页> 外文期刊>Journal of Imaging Science and Technology >Photographic Gelatin Layer Microstructures Revealed by Imaging Secondary Ion Mass Spectrometry
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Photographic Gelatin Layer Microstructures Revealed by Imaging Secondary Ion Mass Spectrometry

机译：成像二次离子质谱揭示的照相明胶层微结构

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摘要

We have used the imaging secondary ion mass spectrometry (SIMS) technique to study fundamental aspects of the chemistry and morphology of photographic gelatin. Studies of thin, dilute gelatin layers spread on flat supports provide information about the fibril macrostructure of the gelatin and about the interaction of the gelatin with embedded silver halide crystals. The structure of the dried thin layers is a function of many parameters, including the pH of the gelatin solution before dispersal. Also, gelatin fibrillar structures form and are oriented by the surfaces of tabular and cubic AgBrX crystals. The dimensions of these fibrils associated with the crystals are many times larger than the expected dimension of an isolated gelatin triple helix. Cross sections through a commercial film are also examined with SIMS at high spatial resolution (better than 100 nm). The results are discussed in the context of current theories about the structure of gelatin and how this structure affects the photographic properties of silver halide films. We compare and review the findings from other instrumental methods.
机译：我们已经使用成像二次离子质谱（SIMS）技术来研究照相明胶的化学和形态学的基本方面。研究了在平坦支撑物上稀薄的稀明胶层的分布，提供了有关明胶的原纤维宏观结构以及明胶与嵌入的卤化银晶体相互作用的信息。干燥的薄层的结构是许多参数的函数，包括分散之前的明胶溶液的pH值。同样，明胶原纤维结构形成并由板状和立方AgBrX晶体的表面定向。这些与晶体相关的原纤维的尺寸比分离的明胶三重螺旋的预期尺寸大许多倍。还使用SIMS在高空间分辨率（大于100 nm）下检查了商业薄膜的横截面。在有关明胶结构以及该结构如何影响卤化银胶片照相性能的现有理论的背景下讨论了该结果。我们比较并审查了其他仪器方法的发现。

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