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Fabrication of TiSi2 using microwave hydrogen plasma annealing

机译:微波氢等离子体退火制备TiSi2

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摘要

A new method, microwave hydrogen plasma annealing of sputter-deposited titanium films on an Si (111) substrate, was used to fabricate TiSi2 films. The films were characterized by x-ray diffraction, Auger electron spectroscopy, sputter depth profiling, and four-point probe resistivity measurements. Polycrystalline TiSi2, dominated by components with (040) orientation, was grown at the annealing temperature of 800 °C. The microwave hydrogen plasma was considered not only to provide the heat for the solid-phase reaction, but also to promote the solid-phase reaction by enhancing atom mobility and diffusion.
机译:一种新的方法,在Si(111)衬底上溅射沉积的钛膜的微波氢等离子体退火,被用于制造TiSi2 膜。薄膜通过X射线衍射,俄歇电子能谱,溅射深度分析和四点探针电阻率测量来表征。以(040)取向的组分为主的多晶TiSi2 在800°C的退火温度下生长。认为微波氢等离子体不仅为固相反应提供热量,而且还通过增强原子迁移率和扩散来促进固相反应。

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  • 来源
  • 作者

    Tao Wang; Hi-Deok Lee; Y. B. Dai;

  • 作者单位

    Microelectronic Device ampamp System Laboratory Department of Electronics Engineering Chungnam National University Gung-Dong Yusong-Gu 305-764 Daejeon Korea;

    Microelectronic Device ampamp System Laboratory Department of Electronics Engineering Chungnam National University Gung-Dong Yusong-Gu 305-764 Daejeon Korea;

    School of Materials Science and Engineering ShangHai Jiao Tong University 1954 Huashan Street 200030 Peoples Republic of China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    microwave hydrogen plasma annealing; silicide; titanium;

    机译:微波氢等离子体退火;硅化物;钛;

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