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首页> 外文期刊>Journal of Materials Research >Mechanical and tribological properties of AlCuFe quasicrystal and Al(Si)CuFe approximant thin films
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Mechanical and tribological properties of AlCuFe quasicrystal and Al(Si)CuFe approximant thin films

机译：AlCuFe准晶体和Al（Si）CuFe近似薄膜的力学和摩擦学性能

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摘要

Multilayered thin films of Al/Cu/Fe have been prepared by magnetron sputtering and annealed into quasicrystalline and approximant phases on Al_2O_3 and Si substrates, respectively. The nanomechanical and nanotribological properties, such as hardness, elastic modulus, friction, and toughness, have been measured using a triboindenter and analytical methods. The approximant phase was proved to be slightly harder than the quasicrystalline phase with a hardness of about 15.6 GPa, and with a similar elastic modulus of about 258 GPa. These values however decreased rapidly with an increasing amount of Si in the approximant. The indentation toughness of the approximant, ＜0.1 MPa/m~(1/2), was however inferior to that of the quasicrystals with 1.5 MPa/m~(1/2). Friction coefficients were measured in a range of 0.10-0.14 for both the quasicrystalline and approximant thin films.
机译：通过磁控溅射制备了多层Al / Cu / Fe薄膜，并分别在Al_2O_3和Si衬底上退火成准晶相和近似相。纳米机械和纳米摩擦性能，例如硬度，弹性模量，摩擦和韧性，已使用摩擦压痕仪和分析方法进行了测量。事实证明，近似相比准结晶相稍硬，其硬度约为15.6 GPa，弹性模量约为258 GPa。然而，随着Si的增加，这些值迅速降低。但是，近似值的压痕韧性＜0.1 MPa / m〜（1/2）低于1.5 MPa / m〜（1/2）的准晶体。准晶体薄膜和近似薄膜的摩擦系数都在0.10-0.14的范围内测量。

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  • 来源
    《Journal of Materials Research》 |2016年第2期|232-240|共9页
  • 作者

    Simon Olsson; Esteban Broitman; Magnus Garbrecht; Jens Birch; Lars Hultman; Fredrik Eriksson;

  • 作者单位

    Thin Film Physics Division, IFM, Linkoeping University, SE-581 83 Linkoeping, Sweden;

    Thin Film Physics Division, IFM, Linkoeping University, SE-581 83 Linkoeping, Sweden;

    Thin Film Physics Division, IFM, Linkoeping University, SE-581 83 Linkoeping, Sweden;

    Thin Film Physics Division, IFM, Linkoeping University, SE-581 83 Linkoeping, Sweden;

    Thin Film Physics Division, IFM, Linkoeping University, SE-581 83 Linkoeping, Sweden;

    Thin Film Physics Division, IFM, Linkoeping University, SE-581 83 Linkoeping, Sweden;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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