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首页> 外文期刊>Journal of Materials Research >Residual Stress And Strain-free Lattice-parameter Depth Profiles In A γ'-fe_4n_(1-x) Layer On An α-fe Substrate Measured By X-ray Diffraction Stress Analysis At Constant Information Depth
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Residual Stress And Strain-free Lattice-parameter Depth Profiles In A γ'-fe_4n_(1-x) Layer On An α-fe Substrate Measured By X-ray Diffraction Stress Analysis At Constant Information Depth

机译：通过恒定信息深度下的X射线衍射应力分析测量α-fe基底上γ'-fe_4n_（1-x）层中的残余应力和无应变晶格参数深度分布

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摘要

The residual stress and lattice-parameter depth profiles in a γ'-Fe_4N_(1-x) layer (6-μm thickness) grown on top of an a-Fe substrate were investigated using x-ray diffraction stress analysis at constant penetration depths. Three different reflections (220, 311, and 222) were recorded at six different penetration depths using three different wavelengths. At each penetration depth, x-ray diffraction stress analysis was performed on the basis of the sin~2ψ method. As a result, the residual-stress depth profile was obtained from the measured lattice strains. The lattice spacings measured in the strain-free direction were used to determine the (strain-free) lattice-parameter depth profile. The nitrogen-concentration depth profile in the layer was calculated by applying a relationship between the (strain-free) γ' lattice parameter and the nitrogen concentration. It was found that the strain-free lattice-parameter depth profile as derived from the 311 reflections is best compatible with nitrogen concentrations at the surface and at the γ'/α interface as predicted on the basis of local thermodynamic equilibrium. It could be shown that the 311 reflection is most suitable for the analysis of lattice-parameter and residual stress depth profiles because the corresponding x-ray elastic constants exhibit the least sensitivity to the type of and changes in grain interaction. The depth-dependence of the grain interaction could be revealed. It was found that the grain interaction changes from Voigt-type near the surface to Reuss-type at the layer/substrate interface.
机译：使用X射线衍射应力分析在恒定穿透深度下研究了在a-Fe衬底顶部生长的γ'-Fe_4N_（1-x）层（6-μm厚度）中的残余应力和晶格参数深度分布。使用三个不同的波长在六个不同的穿透深度处记录了三个不同的反射（220、311和222）。在每个穿透深度处，基于sin〜2ψ方法进行了X射线衍射应力分析。结果，从测得的晶格应变获得残余应力深度分布。在无应变方向上测得的晶格间距用于确定（无应变）晶格参数深度曲线。通过应用（无应变）γ'晶格参数和氮浓度之间的关系来计算层中氮浓度深度分布。已发现，根据局部热力学平衡预测，从311次反射得出的无应变晶格参数深度曲线与表面和γ'/α界面处的氮浓度最佳兼容。可以表明，311反射最适合分析晶格参数和残余应力深度分布，因为相应的X射线弹性常数对晶粒相互作用的类型和变化表现出最小的敏感性。可以揭示晶粒相互作用的深度依赖性。发现在层/基底界面处，晶粒相互作用从表面附近的Voigt型改变为Reuss型。

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  • 来源
    《Journal of Materials Research》 |2009年第4期|1342-1352|共11页
  • 作者

    M. Wohlschloegel; U. Welzel; E.J. Mittemeijer;

  • 作者单位

    Max Planck Institute for Metals Research, D-70569 Stuttgart, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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