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Prediction of formation of intermetallic compounds in diffusion couples

机译:扩散对中金属间化合物形成的预测

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摘要

Formation of intermetallic compounds (IMCs) at the interface between two metals during soldering processing exerts much influence on the electrical and mechanical performance of integrate circuits (ICs). Considering both of the thermodynamic and kinetic factors (including nucleation and growth) on phase formation, a new model capable of predicting phase formation sequence at the interface between two metals with different structures has been proposed in this work. Application of this new model on the interfacial reactions between pure elemental pairs of metals such as Ni/Sn, Cu/In, Cu/Sn, and Co/Sn at different temperatures shows good agreement between predictions by this model and experimental observations.
机译:在焊接过程中,两种金属之间的界面处形成金属间化合物(IMC)对集成电路(IC)的电气和机械性能产生很大影响。考虑到相形成的热力学和动力学因素(包括成核和生长),在这项工作中提出了一种能够预测两种结构不同的金属之间的相形成顺序的新模型。该新模型在纯元素金属对(例如Ni / Sn,Cu / In,Cu / Sn和Co / Sn)在不同温度下的界面反应上的应用表明,该模型的预测与实验观察结果之间具有很好的一致性。

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