Atomic resolution transmission electron microscopy of surfaces

Ann N. Chiaramonti; Laurence D. Marks

首页> 外文期刊>Journal of Materials Research >Atomic resolution transmission electron microscopy of surfaces

【24h】

Atomic resolution transmission electron microscopy of surfaces

机译：表面的原子分辨率透射电镜

获取原文

获取原文并翻译 | 示例

掌桥外文数据库（机构版） >>

开具论文收录证明 >>

文献代查 >>

页面导航

摘要
著录项
相似文献
相关主题

摘要

A brief overview of transmission electron microscopy as it applies specifically to obtaining surface crystallographic information is presented. This review will encompass many of the practical aspects of obtaining surface crystal information from a transmission electron microscope, including equipment requirements, experimental techniques, sample preparation methods, data extraction and image processing, and complimentary techniques.

机译：本文简要介绍了透射电子显微镜，因为它专门用于获取表面晶体学信息。这篇综述将涵盖从透射电子显微镜获得表面晶体信息的许多实际方面，包括设备要求，实验技术，样品制备方法，数据提取和图像处理以及互补技术。

著录项

来源
《Journal of Materials Research》 |2005年第7期|p.1619-1627|共9页
作者
Ann N. Chiaramonti; Laurence D. Marks;
展开▼
作者单位

Institute for Environmental Catalysis, Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208-3108;

展开▼
收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类工程材料学;
关键词

相似文献

外文文献
中文文献
专利

1. Atomic surface diffusion on Pt nanoparticles quantified by high-resolution transmission electron microscopy [J] . S. Schneider, A. Surrey, D. Pohl, Micron: The international research and review journal for microscopy . 2014,第Null期

机译：通过高分辨率透射电子显微镜对Pt纳米颗粒上的原子表面扩散进行定量
2. Atomic-resolution three-dimensional imaging of germanium self-interstitials near a surface: Aberration-corrected transmission electron microscopy [J] . D. Alloyeau, B. Freitag, S. Dag, Physical review . 2009,第1期

机译：表面附近锗自填隙的原子分辨率三维成像：像差校正的透射电子显微镜
3. Advances in Atomic Resolution In Situ Environmental Transmission Electron Microscopy and 1 angstrom Aberration Corrected In Situ Electron Microscopy [J] . Gai PL, Boyes ED Microscopy research and technique . 2009,第3期

机译：原子分辨率原位环境透射电子显微镜和1埃像差校正的原位电子显微镜的研究进展
4. Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM): Complementary Techniques for High Resolution Surface Investigations [C] . P. Russell, D. Batchelor, J. Thornton International conference on surface modification technologies . 2002

机译：扫描电子显微镜（SEM）和原子力显微镜（AFM）：高分辨率表面调查的互补技术
5. Studies of single nanoparticle systems by localized surface plasmon resonance spectroscopy, atomic force microscopy, transmission electron microscopy, and combinations thereof [D] . Sherry, Leif Jorstad 2007

机译：通过局部表面等离子体共振光谱，原子力显微镜，透射电子显微镜及其组合研究单个纳米粒子系统
6. Data on atomic structures of precipitates in an Al-Mg-Cu alloy studied by high resolution transmission electron microscopy and first-principles calculations [O] . Xuanliang Chen, Calin D. Marioara, Sigmund J. Andersen, 2021

机译：通过高分辨率透射电子显微镜和第一原理计算研究了Al-Mg-Cu合金中沉淀物原子结构的数据
7. Atomic Resolution Transmission Electron Microscopy of Perovskite Nanoparticle Surfaces Exposed to Gas Environments at Elevated Temperatures [O] . Barnaby D. A. Levin, Armando Cardenas, J. Mark Weller, 2018

机译：钙钛矿纳米粒子表面的原子分辨率透射电子显微镜暴露于升高温度下的气体环境

Atomic resolution transmission electron microscopy of surfaces

摘要

著录项

相似文献

相关主题

期刊订阅