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首页> 外文期刊>Journal of Materials Research >A new approach to characterization of the transition temperatures of thin film NiTi shape memory alloys
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A new approach to characterization of the transition temperatures of thin film NiTi shape memory alloys

机译:表征NiTi薄膜形状记忆合金转变温度的新方法

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摘要

A novel approach in determining the transition temperatures of NiTi shape memory alloys was investigated and compared with conventional techniques. The technique is based on microthemal analysis using a scanning thermal microscope (SThM). In particular, this method has the potential to allow the transformation temperatures of thin films to be investigated in situ. Thin film shape memory alloys have potential applications, such as microactuators, where conventional analysis techniques are either not directly applicable to such samples or are difficult to perform.
机译:研究了一种确定NiTi形状记忆合金转变温度的新颖方法,并将其与常规技术进行了比较。该技术基于使用扫描热显微镜(SThM)的微量热分析。特别地,该方法具有允许就地研究薄膜的转变温度的潜力。薄膜形状记忆合金具有潜在的应用,例如微致动器,其中常规分析技术要么不能直接应用于此类样品,要么难以执行。

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