首页> 外文期刊>Journal of Materials Research >Microstructure and misfit relaxation in SrTiO_3/SrRuO_3 bilayer films on LaAlO_3(100)substrates
【24h】

Microstructure and misfit relaxation in SrTiO_3/SrRuO_3 bilayer films on LaAlO_3(100)substrates

机译:LaAlO_3(100)衬底上SrTiO_3 / SrRuO_3双层薄膜的微观结构和失配弛豫

获取原文
获取原文并翻译 | 示例
           

摘要

We studied the microstructure of SrTiO_3/SrRuO_3 bilayer films on(001)LaAlO_3 substrates by high-resolution transmission electron microscopy. At the SrRuO_3/LaAlO_3 interface a defect configuration of stacking faults and nanotwins bounding either Frank partial dislocations or Shockley partial dislocations and complex interaction between these planar defects were found to be the dominant means of misfit accommodation. The misfit in the SrTiO_3/SrRuO_3 system, however, is mainly accommodated by Elastic strain.
机译:我们通过高分辨率透射电子显微镜研究了在(001)LaAlO_3衬底上的SrTiO_3 / SrRuO_3双层薄膜的微观结构。在SrRuO_3 / LaAlO_3界面,堆垛层错和纳米孪晶的缺陷配置限制了Frank部分位错或Shockley部分位错,这些平面缺陷之间的复杂相互作用是失配调节的主要手段。但是,SrTiO_3 / SrRuO_3系统的失配主要由弹性应变解决。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号