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首页> 外文期刊>Journal of Materials Research >Rapid thermal processing of lead zirconate titanate thin films on Pt-GaAs substrates based on a novel 1,1,1-tris(hydroxymethyl)ethane sol-gel route
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Rapid thermal processing of lead zirconate titanate thin films on Pt-GaAs substrates based on a novel 1,1,1-tris(hydroxymethyl)ethane sol-gel route

机译:基于新型1,1,1-三(羟甲基)乙烷溶胶-凝胶路线的Pt-GaAs衬底上锆钛酸铅钛薄膜的快速热处理

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摘要

Thin films of 1ead zirconate titanate (PZT) having a nominal composition of Pb(Zr_0.53Ti_0.47)O_3 have been prepared on platinized GaAs (Pt-GaAs) substrates using a new l,l,l-tris(hydroxymethyl)ethane (THOME) based sol-gel technique. Rapid thermal processing (RTP) techniques were used to decompose the sol-gel layer to PZT in an effort to avoid problems of Ga/As outdiffusion into the PZT. A crystalline PZT film was produced by firing the sol-gel coatings at 600 or 650 "C for a dwell time of l s using RTP. A single deposition of the precursor sol resulted in a 0.4 mum thick PZT film. X-ray diffraction measurements revealed that the films possessed a high degree of (l 1 l) preferred orientation. Measured average values of remanent polarization (P.) and coercive field (E_c.) for the film annealed at 650 deg C for 1 s were 24 mu C/cm@' and 32 kV/cm, respectively, together with a low frequency dielectric constant and loss~2 tangent at l kHz of 950 and 0.02. These values are comparable to those obtainable on platinized silicon (Pt--Si) substrates using conventional sol-ge1 methods, and are an improvement on PZT thin films prepared on platinized GaAs using an earlier sol-gel route based on l,3-propanediol.
机译:使用新的l,l,l-三(羟甲基)乙烷(pt(Zr_0.53Ti_0.47)O_3的标称成分为Pb(Zr_0.53Ti_0.47)O_3的1ead钛酸钛(PZT)薄膜已在铂化GaAs(Pt-GaAs)基板上制备THOME)的溶胶-凝胶技术。为了避免Ga / As扩散到PZT中的问题,使用了快速热处理(RTP)技术将溶胶-凝胶层分解为PZT。通过使用RTP在600或650℃下烧制溶胶-凝胶涂层ls停留时间ls来生产结晶PZT膜。一次沉积前体溶胶会形成0.4微米厚的PZT膜。X射线衍射测量表明薄膜具有较高的(l 1 l)择优取向,在650℃退火1 s的薄膜的剩余极化强度(P.)和矫顽场(E_c。)的测量平均值为24μC / cm @'和32 kV / cm,分别具有950和0.02的低频介电常数和在1 kHz时的损耗〜2切线,这些值与使用常规溶胶在铂硅(Pt-Si)衬底上可获得的值相当-ge1方法,并且是使用较早的基于1,3-丙二醇的溶胶-凝胶路线在镀铂GaAs上制备的PZT薄膜的改进。

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