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首页> 外文期刊>Journal of materials science >Microstructural evolution of Cu-Sn-Ni compounds in full intermetallic micro-joint and in situ micro-bending test
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Microstructural evolution of Cu-Sn-Ni compounds in full intermetallic micro-joint and in situ micro-bending test

机译:全金属间微接头和原位微弯曲试验中Cu-Sn-Ni化合物的组织演变

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摘要

This study focuses on the microstructural evolution process of Cu–Sn–Ni intermetallic compounds (IMCs) interlayer in the micro-joints, formed from the initial Ni/Sn (1.5 µm)/Cu structure through transient liquid phase (TLP) soldering. Under the bonding temperature of 240 °C, the micro-joints evolve into Ni/(Cu, Ni)~(6)Sn~(5)/(Cu, Ni)~(3)Sn/Cu structure, where the interfacial reactions on Cu/Sn and Sn/Ni are suppressed by the atoms diffusing from the opposite side. The thickness of (Cu, Ni)~(3)Sn layer on plated Cu layer still increases with the prolonged dwell time. When the bonding temperature was elevated to 290 °C, the phase transformation of (Cu, Ni)~(6)Sn~(5)into (Cu, Ni)~(3)Sn has been accelerated, thus the majority of IMCs interlayer is constituted with (Cu, Ni)~(3)Sn. However, a small amount of Ni-rich (Cu, Ni)~(6)Sn~(5)phases still remain near the Ni substrate and some of them close to the center-line of IMCs interlayer. The state between (Cu, Ni)~(6)Sn~(5)and the adjacent (Cu, Ni)~(3)Sn tends to reach equilibrium in Ni content based on the observation from Transmission Electron Microscope (TEM). In addition, the Cu–Sn–Ni IMCs micro-cantilevers were fabricated from these micro-joints using Focus Ion Beam (FIB) for the in situ micro-bending test, the results indicate a high ultimate tensile strength as well as the brittle fracture in the inter- and trans-granular modes.
机译:这项研究的重点是微接头中Cu-Sn-Ni金属间化合物(IMC)中间层的微观结构演变过程,该过渡层是由初始Ni / Sn(1.5µm)/ Cu结构通过瞬时液相(TLP)焊接形成的。在240°C的键合温度下,微接头演变为Ni /(Cu,Ni)〜(6)Sn〜(5)/(Cu,Ni)〜(3)Sn / Cu结构,其中发生界面反应Cu / Sn和Sn / Ni的原子被相反侧扩散的原子所抑制。随着停留时间的延长,镀铜层上的(Cu,Ni)〜(3)Sn层的厚度仍然增加。当键合温度升至290°C时,(Cu,Ni)〜(6)Sn〜(5)转变为(Cu,Ni)〜(3)Sn的相变得到加速,因此大多数IMC中间层由(Cu,Ni)〜(3)Sn构成。然而,少量富Ni(Cu,Ni)〜(6)Sn〜(5)相仍然保留在Ni衬底附近,并且其中一些靠近IMC中间层的中心线。根据透射电子显微镜(TEM)的观察,(Cu,Ni)〜(6)Sn〜(5)与相邻的(Cu,Ni)〜(3)Sn之间的状态趋于达到平衡。另外,使用聚焦离子束(FIB)从这些微接头制造了Cu-Sn-Ni IMC微悬臂梁,用于原位微弯曲试验,结果表明,其高极限拉伸强度以及脆性断裂在晶间和跨晶模式。

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