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Characterization of electroplated FeSe thin films

机译：电镀FeSe薄膜的表征

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摘要

Thin films of iron selenide (FeSe) were elec-trodeposited on tin oxide coated conducting glass substrates at various bath temperatures, deposition potential and solution pH values. The deposited films were characterized by X-ray diffraction, energy dispersive X-ray analysis, scanning electron microscopy and optical absorption techniques, respectively. The structure was found to be hexagonal with preferential orientation along {002} plane. X-ray line profile analysis technique by the method of variance has been used to evaluate the micro-structural parameters. The variation of microstructural parameters with bath temperature, deposition potential and solution pH values were studied. The observed results are discussed in detail.
机译：在各种浴温，沉积电势和溶液pH值下，将硒化铁（FeSe）薄膜电沉积在涂有氧化锡的导电玻璃基板上。分别通过X射线衍射，能量色散X射线分析，扫描电子显微镜和光吸收技术表征沉积的膜。发现该结构是六边形的，具有沿{002}平面的优先取向。利用方差法的X射线线轮廓分析技术已被用于评估微结构参数。研究了熔池温度，沉积电位和溶液pH值的微结构参数的变化。观察结果将详细讨论。

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  • 来源
    《Journal of materials science》 |2009年第8期|727-734|共8页
  • 作者

    S. Thanikaikarasan; T. Mahalingam; M. Raja; Taekyu Kim; Yong Deak Kim;

  • 作者单位

    Department of Physics, Alagappa University, Karaikudi 630 003, India;

    Department of Physics, Alagappa University, Karaikudi 630 003, India;

    Department of Physics, Alagappa University, Karaikudi 630 003, India;

    Department of Electrical and Computer Engineering, The University of Arizona, Tucson, AZ 85721, USA;

    Department of Electrical and Computer Engineering, Ajou University, Suwon 443 749, Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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