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首页> 外文期刊>Journal of Materials Science. Materials in Electronics >Optical and structural properties of ZnO + Zn_2TiO_4 thin films prepared by the sol-gel method
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Optical and structural properties of ZnO + Zn_2TiO_4 thin films prepared by the sol-gel method

机译：溶胶-凝胶法制备ZnO + Zn_2TiO_4薄膜的光学和结构性质

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ZnO + Zn_2TiO_4 thin films were obtained by the sol-gel method using precursor solutions with different Ti/Zn ratios in the 0.18-2.13 range. The films were deposited on glass substrates and annealed in an open atmosphere at 550 ℃. The oxide was characterized by X-ray diffraction and photoacoustic (PA) spectroscopy. The films were constituted of polycrystalline ZnO for the lowest Ti/Zn ratio (0.18), polycrystalline Zn_2TiO_4 for the 0.70 and 1.0 ratios, and mixes of both oxides for the intermediate ratios (0.32 and 0.50). For the highest ratios studied (1.44 and 2.13), the films were amorphous. The energy band gap (E_g) values were determined from optical absorption spectra, measured by means of the PA technique spectra. E_g varied in the 3.15 eV (ZnO) to 3.70 eV (Zn_2TiO_4) range.
机译：ZnO + Zn_2TiO_4薄膜是通过溶胶-凝胶法，采用Ti / Zn比在0.18-2.13范围内的前驱体溶液获得的。将膜沉积在玻璃基板上，并在550℃的开放气氛中退火。通过X射线衍射和光声（PA）光谱对氧化物进行表征。该膜由具有最低Ti / Zn比（0.18）的多晶ZnO，具有0.70和1.0比率的多晶Zn_2TiO_4以及两种氧化物的中间比率（0.32和0.50）的混合物组成。对于研究的最高比率（1.44和2.13），薄膜是无定形的。由利用PA技术光谱测量的光学吸收光谱确定能带隙（E_g）值。 E_g在3.15 eV（ZnO）至3.70 eV（Zn_2TiO_4）范围内变化。

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