...
首页> 外文期刊>Journal of Materials Science. Materials in Electronics >Thermal quenching of the photoluminescence in amorphous silicon-carbon alloys doped with Er ions
【24h】

Thermal quenching of the photoluminescence in amorphous silicon-carbon alloys doped with Er ions

机译:掺Er离子的非晶硅碳合金中光致发光的热猝灭

获取原文
获取原文并翻译 | 示例
           

摘要

Recombination of electron-hole pairs in the bandtails of Er-doped Si_(1-x)C_x:H films yields besides the intrinsic emission a narrow band at 1.5 μm resulting from energy transfer to Er~(3+) ions by resonant Forster transfer from electron-hole pairs in the host. Host and guest emission decay at elevated temperatures due to competing non-radiative recombination with activation energies around 120 meV and 40 meV. The larger activation energy results from carrier motion and affects both emission bands while the smaller activation energy is attributed to on-site multiphonon recombination which affects only the intrinsic luminescence and not the emission of Er ions.
机译:掺Er的Si_(1-x)C_x:H薄膜的带隙中电子-空穴对的重组产生了本征发射,在1.5μm处产生窄带,这是由于共振的Forster转移将能量转移至Er〜(3+)离子来自宿主中的电子-空穴对。由于竞争性的非辐射重组以及约120 meV和40 meV的活化能,主机和客体发射在高温下衰减。较大的活化能归因于载流子运动并影响两个发射带,而较小的活化能归因于现场的多声子复合,这种复合仅影响固有发光而不影响Er离子的发射。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号