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首页> 外文期刊>Journal of nano research >A Drain Current and Transconductance Analytical Model for Symmetric Double Gate Junctionless FENT
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A Drain Current and Transconductance Analytical Model for Symmetric Double Gate Junctionless FENT

机译:对称双栅极连接件的漏极电流和跨导分析模型

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摘要

This paper presents an analytical model of various electrical parameters for an ultra thin symmetric double gate (SDG) junctionless field effect nanowire transistor (JLFENT). The model works for all the regions of operation of the nanowire transistor without using any fitting parameter. The surface potential is derived based on the solutions of Poisson’s and current continuity equations by using appropriate boundary conditions. The Pao–Sah double integral was used to obtain the drain current, transconductance and drain conductance. The results obtained from analytical model are validated by comparing with GENIUS 3D TCAD simulations. The simplicity of the model makes it appropriate to be a SPICE compatible model.
机译:本文介绍了用于超薄对称双栅极(SDG)结场效应纳米线晶体管(JLFENT)的各种电气参数的分析模型。该模型适用于纳米线晶体管的所有操作区域而不使用任何配合参数。通过使用适当的边界条件,基于Poisson和当前连续性方程的解决方案来导出表面电位。 Pao-Sah双积分用于获得漏极电流,跨导和漏极电导。通过与天才3D TCAD模拟进行比较验证了从分析模型获得的结果。模型的简单性使其适合成为Spice兼容的模型。

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