首页> 外文期刊>Journal of nano research >Study of Structural, Surface Morphological and Dielectric Properties of Cu-doped Tin Oxide Nanoparticles
【24h】

Study of Structural, Surface Morphological and Dielectric Properties of Cu-doped Tin Oxide Nanoparticles

机译:掺杂铜的氧化锡纳米粒子的结构,表面形态和介电性能的研究

获取原文
获取原文并翻译 | 示例
           

摘要

Cu doped SnO2 nanoparticles were prepared using the chemical precipitation method. The Cu doped SnO2 nanoparticles have been characterized by powder X-ray diffraction (XRD) analysis, Scanning electron microscopy (SEM), elemental dispersive X-ray (EDX) analysis, Transmission electron microscopy (TEM), UV-Visible absorption spectrum and Dielectric studies. The average crystallite size of Cu doped SnO2 nanoparticles was calculated from the X-ray diffraction (XRD) pattern and found to be 15 nm and it was further confirmed from the transmission electron microscopy (TEM) studies. The scanning electron microscopy (SEM) analysis showed that the nanoparticles agglomerate forming spherical-shaped particles. The elemental composition of Cu doped SnO2 nanoparticles was analyzed by Energy Dispersive X-ray (EDX) spectrum. The optical absorption study clearly shows that the absorption edge shift towards the higher wavelength region. The dielectric properties of Cu doped SnO2 nanoparticles have been studied in the different frequency at different temperatures. The dielectric constant and dielectric loss of the Cu doped SnO2 nanoparticles decreases with increase in frequency.
机译:采用化学沉淀法制备了掺Cu的SnO2纳米粒子。通过粉末X射线衍射(XRD)分析,扫描电子显微镜(SEM),元素色散X射线(EDX)分析,透射电子显微镜(TEM),紫外-可见吸收光谱和电介质表征了掺杂Cu的SnO2纳米颗粒学习。由X射线衍射(XRD)图计算出掺杂Cu的SnO 2纳米颗粒的平均微晶尺寸,发现其为15nm,并且由透射电子显微镜(TEM)研究进一步证实。扫描电子显微镜(SEM)分析表明,纳米颗粒附聚形成球形颗粒。通过能量色散X射线(EDX)光谱分析了掺杂Cu的SnO2纳米颗粒的元素组成。光学吸收研究清楚地表明,吸收边缘向较高波长区域移动。研究了Cu掺杂的SnO2纳米粒子在不同频率,不同温度下的介电性能。掺Cu的SnO 2纳米颗粒的介电常数和介电损耗随频率的增加而降低。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号