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首页> 外文期刊>Journal of Parallel and Distributed Computing >Design and automation of VLSI architectures for bidirectional scan based fault localization approach in FPGA fabric aware cellular automata topologies
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Design and automation of VLSI architectures for bidirectional scan based fault localization approach in FPGA fabric aware cellular automata topologies

机译：FPGA结构意识到蜂窝自动机拓扑上基于双向扫描的故障定位方法的VLSI架构的设计与自动化

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摘要

Cellular automata (CA) have received significant attention in VLSI design for the inherent architectural advantages of modularity, cascadability, simplicity and localized interconnections. In this paper, we have designed FPGA fabric aware CA circuit topologies with a built-in bidirectional scan chain to facilitate fine-grained fault localization of any faulty logic element configured for circuit realization, without increase in logic resources or critical path delay. The scan path arrangement may also be used for seeding the CA with the desired initial state. The generation of circuit description files has been completely automated which further facilitates to single out the exact faulty logic element (if any) on which the circuit has been configured. The proposed architectures outperform the state-of-the-art error detection and fault localization techniques tailored for FPGA implementations both in terms of area and speed. (C) 2019 Elsevier Inc. All rights reserved.
机译：Cellular Automata（CA）在VLSI设计中获得了显着的关注，以实现模块化，级联，简单和局部互连的固有架构优势。在本文中，我们设计了使用内置双向扫描链的FPGA结构意识CA电路拓扑，以便于配置用于电路实现的任何故障逻辑元件的细粒度故障定位，而不会增加逻辑资源或关键路径延迟。扫描路径布置也可以用于将CA与所需的初始状态进行播种。电路描述文件的生成已经完全自动化，进一步促进了配置电路的精确故障逻辑元素（如果有的话）。拟议的架构优于在区域和速度方面为FPGA实现量身定制的最先进的错误检测和故障定位技术。 （c）2019 Elsevier Inc.保留所有权利。

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