Special Issue on Dynamic Analysis and Testing of Embedded Software

W. Eric Wong; W.K. Chan; T.H.Tse; Fei-Ching Kuo

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Special Issue on Dynamic Analysis and Testing of Embedded Software

机译：嵌入式软件动态分析与测试专刊

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Research challenges in dynamic analysis and testing have been studied for decades. Nonetheless, as new hardware and software technologies emerge and become more powerful, many interest ing techniques that were previously considered to be impractical or remained unexplored are receiving significant attention. This special issue presents novel research work in the dynamic analysis and testing of embedded software, which also comes with theoret ical or extensive empirical validation of the claimed contributions. Out of 15 submissions, four are accepted for publication based on the reviewers' professional assessments and recommendations.

机译：动态分析和测试中的研究挑战已经研究了数十年。但是，随着新的硬件和软件技术的出现和功能的增强，许多以前被认为是不切实际或尚未探索的有趣技术受到了极大的关注。本期特刊介绍了嵌入式软件的动态分析和测试方面的新颖研究工作，同时也对所主张的内容进行了理论或广泛的经验验证。在15份意见书中，有4份根据审稿人的专业评估和建议被接受发表。

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来源
《The Journal of Systems and Software》 |2012年第1期|p.1-2|共2页
作者
W. Eric Wong; W.K. Chan; T.H.Tse; Fei-Ching Kuo;
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作者单位

The University of Texas at Dallas, Richardson, TX, USA;

City University of Hong Kong, Tat Chee Avenue,Hong Kong;

The University of Hong Kong, Pokfulam,Hong Kong;

Swinburne University of Technology,Melbourne, Australia;

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7. Editorial, Special issue on dynamic analysis and testing of embedded software [O] . Tse TH, Wong WE, Chan WK, 2012

机译：编辑，关于嵌入式软件动态分析和测试的特刊

Special Issue on Dynamic Analysis and Testing of Embedded Software

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