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Identification of a Defect using the Equivalent Load Method

机译:使用等效载荷法识别缺陷

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摘要

This paper will propose an identification algorithm for a small defect in the case of the bending problem of a beam. That is to say, the part where a defect exists is replaced by an equivalent load term. It shows that the defect can be accurately identified even there is observation error if the problem of identifying a defect is converted to that of identifying a load.
机译:本文将针对光束弯曲问题中的小缺陷提出一种识别算法。也就是说,将存在缺陷的部分替换为等效载荷项。它表明,如果将识别缺陷的问题转换为识别负载的问题,则即使存在观察误差,也可以准确地识别缺陷。

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