Electronic parameters and top surface chemical stability of RbPb_2Br_5

著录项

• 来源
  《Materials Chemistry and Physics》 |2012年第1期|82-86|共5页
• 作者

  V.V. Atuchin; L.I. Isaenko; V.G. Kesler; L.D. Pokrovsky; A.Yu. Tarasova;

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• 作者单位

  Laboratory of Optical Materials and Structures, Institute of Semiconductor Physics, SB RAS, Novosibirsk 90, 630090, Russia;

  Laboratory of Crystal Growth, Institute of Geology and Mineralogy, SB RAS, Novosibirsk 90, 630090, Russia;

  Laboratory of Physical Principles for Integrated Microelectronics, Institute of Semiconductor Physics, SB RAS, Novosibirsk 90, 630090, Russia;

  Laboratory of Optical Materials and Structures, Institute of Semiconductor Physics, SB RAS, Novosibirsk 90, 630090, Russia;

  Laboratory of Crystal Growth, Institute of Geology and Mineralogy, SB RAS, Novosibirsk 90, 630090, Russia;

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• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  A. Optical materials; A. Surfaces; B. Crystal growth; C. Reflection high energy electron diffraction (RHEED); C. X-ray photo-emission spectroscopy (XPS); D. Crystallography; D. Surface properties;

  机译：A.光学材料;A.表面;B.晶体生长;C.反射高能电子衍射（RHEED）;C. X射线光发射光谱法（XPS）;D.晶体学;D.表面性质;