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Synthesis and characterization of electrochemically deposited nanocrystalline CdTe thin films

机译:电化学沉积纳米CdTe薄膜的合成与表征

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Electrodeposition is emerging as a method for the synthesis of semiconductor thin films and nanostruc-tures. In this work we prepared the nanocrystalline CdTe thin films on indium tin oxide coated glass substrate from aqueous acidic bath at the deposition temperature 50 ± 1 ℃. The films were grown poten-tiostatically from -0.60 V to -0.82 V with respect to saturated calomel reference electrode. The structural, compositional, morphological and optical properties were investigated using X-ray diffraction (XRD), energy dispersive analysis by X-rays (EDAX), atomic force microscopy (AFM), and UV-vis spectroscopy respectively and cyclic voltammetery. The structural and optical studies revealed that films are nanocrystalline in nature and possess cubic phase, also the films are preferentially oriented along the cubic (111) plane. The effect of cadmium composition on the deposited morphology was also investigated. The size dependent blue shift in the experimentally determined absorption edge has been compared with the theoretical predictions based on the effective mass approximation and tight binding approximation. It is shown that the experimentally determined absorption edges depart from the theoretically calculated values.
机译:电沉积作为合成半导体薄膜和纳米结构的方法正在兴起。在这项工作中,我们从含水酸性浴中以50±1℃的沉积温度在氧化铟锡涂层的玻璃基板上制备了纳米CdTe薄膜。相对于饱和甘汞参比电极,膜从-0.60 V至-0.82 V电位定容生长。分别使用X射线衍射(XRD),X射线能量色散分析(EDAX),原子力显微镜(AFM)和紫外可见光谱和循环伏安法研究了结构,组成,形态和光学性质。结构和光学研究表明,薄膜本质上是纳米晶体,具有立方相,而且薄膜优先沿立方(111)平面取向。还研究了镉组成对沉积形态的影响。实验确定的吸收边缘中与尺寸有关的蓝移已与基于有效质量近似和紧密结合近似的理论预测进行了比较。结果表明,实验确定的吸收边偏离了理论计算值。

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