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首页> 外文期刊>Materials Research Bulletin >Synthesis of fibrous reticulate nanocrystalline n-type MoBi_2(Se_(1-x)Te_x)_5 thin films: Thermocooling applications
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Synthesis of fibrous reticulate nanocrystalline n-type MoBi_2(Se_(1-x)Te_x)_5 thin films: Thermocooling applications

机译:纤维状网状纳米n型MoBi_2(Se_(1-x)Te_x)_5薄膜的合成:热冷却应用

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摘要

In the present investigation n-type MoBi_2(Se_(1-x)Te_x)_5 nanocrystalline thin films with various compositions of Se and Te were successfully deposited on ultrasonically cleaned glass substrates using recently developed Arrested Precipitation Technique (APT). The effect of composition on optical, morphological, structural, electrical and thermocooling properties of MoBi_2(Se_(1-x)Te_x)_5 were investigated using UV-vis-NIR Spectroscopy, scanning electron microscopy, energy dispersive spectroscopy, X-ray diffractometer, thermoelectric power and thermocooling measurements. Thermoelectric properties including electrical conductivity (σ), Seeback coefficient (S) and figure of merit (ZT) were measured at 300 K. Our aim is to investigate thermocooling behavior in respect of variation in composition of Se and Te in MoBi_2(Se_(1-x)Te_x)_5 thin films along with optostructural and optoelectric properties.
机译:在本研究中,使用最近开发的阻滞沉淀技术(APT)将具有各种Se和Te组成的n型MoBi_2(Se_(1-x)Te_x)_5纳米晶体薄膜成功沉积在超声清洗过的玻璃基板上。使用紫外可见近红外光谱,扫描电子显微镜,能量色散谱,X射线衍射仪研究了成分对MoBi_2(Se_(1-x)Te_x)_5的光学,形态,结构,电和热冷却性能的影响,热电功率和热冷却测量。在300 K下测量了包括电导率(σ),回渗系数(S)和品质因数(ZT)在内的热电性能。我们的目的是研究MoBi_2(Se_(1 -x)Te_x)_5薄膜以及光电结构和光电特性。

著录项

  • 来源
    《Materials Research Bulletin》 |2012年第11期|p.3860-3867|共8页
  • 作者单位

    Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur 416004, India;

    Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur 416004, India;

    Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur 416004, India;

    Thin Film Materials Laboratory, Department of Physics, Shivaji University, Kolhapur 416004, India;

    Thin Film Materials Laboratory, Department of Physics, Shivaji University, Kolhapur 416004, India;

    Materials Research Laboratory, Department of Chemistry, Shivaji University, Kolhapur 416004, India;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A. Thin films; A. Chalcogenides; A. Nanostructures; B. Chemical synthesis; C. X-ray diffraction;

    机译:A.薄膜;A.硫属元素化物;A.纳米结构;B.化学合成;C.X射线衍射;

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