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首页> 外文期刊>Materials Science and Engineering >Process-induced geometric defect sensitivity of Ti-6Al-4V lattice structures with different mesoscopic topologies fabricated by electron beam melting
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Process-induced geometric defect sensitivity of Ti-6Al-4V lattice structures with different mesoscopic topologies fabricated by electron beam melting

机译：电子束熔化制备的具有不同介观拓扑结构的Ti-6Al-4V晶格结构的过程诱导几何缺陷敏感性

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摘要

Ti-6Al-4V lattice structures with different cell configurations are fabricated by electron beam melting (EBM) method. Two different cell topologies (octet truss and regular rhombic dodecahedron lattice) corresponding to stretching-dominated and bending-dominated respectively are taken into consideration. The mechanical properties of these specimens are examined by quasi-static compression experiments which are conducted by electronic universal machine, while the deformation evolutions of all the specimens are captured by a digital camera. The results indicate that the specimens with rhombic dodecahedron cells exhibit higher specific strength than the octet truss structures. This unusual phenomenon is proved to be caused by the geometric imperfections in the printed stretching-dominated structures. Then the X-ray computed tomography is adopted to capture the process-induced defects in the EBM-printed specimens, and virtual tests are performed by the X-ray tomography based 3D reconstruction model. The computational study explains that the collapse strength of the rhombic dodecahedron (RD) lattice is mainly affected by the surface roughness of the struts, while the weak connection at the joints of the struts leads to the significant reduction in the strength of the octet truss specimens. Meanwhile, the dynamic performance of the printed specimens is predicted by ideal shock wave model and validated by numerical simulation. The results indicate that the defects lead to the significant discrepancy between the theoretical prediction and numerical simulation of octet truss structure, but the failure mode transition of RD lattice structure can be well predicted by the analytical model.
机译：通过电子束熔化（EBM）方法制备了具有不同晶胞结构的Ti-6Al-4V晶格结构。考虑了分别对应于拉伸为主和弯曲为主的两种不同的单元拓扑（八角形桁架和规则的菱形十二面体晶格）。这些样品的机械性能通过电子万能机进行的准静态压缩实验来检查，而所有样品的变形演变都由数码相机捕获。结果表明，具有菱形十二面体细胞的标本比八重体桁架结构具有更高的比强度。事实证明，这种异常现象是由印刷拉伸为主的结构中的几何缺陷引起的。然后采用X射线计算机断层扫描技术来捕获EBM打印的样本中的过程引起的缺陷，并通过基于X射线断层扫描的3D重建模型进行虚拟测试。计算研究表明，菱形十二面体（RD）晶格的塌陷强度主要受支撑杆表面粗糙度的影响，而支撑杆连接处的弱连接导致八角形桁架样品的强度显着降低。 。同时，通过理想的冲击波模型预测了印刷样品的动态性能，并通过数值模拟对其进行了验证。结果表明，缺陷导致八角形桁架结构的理论预测与数值模拟之间存在显着差异，但解析模型可以很好地预测RD晶格结构的破坏模式转变。

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