Plasticity evolution in nanoscale Cu/Nb single-crystal multilayers as revealed by synchrotron X-ray microdiffraction

著录项

• 来源
  《Materials Science and Engineering》 |2015年第21期|6-12|共7页
• 作者

  A.S. Budiman; Karthic R. Narayanan; N. Li; J. Wang; N. Tamura; M. Kunz; A. Misra;

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• 作者单位

  Singapore University of Technology and Design, Singapore 138682, Singapore,Center for Integrated Nanotechnologies (CINT), Los Alamos National Laboratory (LANL), Los Alamos, NM 87545, United States;

  Singapore University of Technology and Design, Singapore 138682, Singapore;

  Center for Integrated Nanotechnologies (CINT), Los Alamos National Laboratory (LANL), Los Alamos, NM 87545, United States;

  MST- 8, Los Alamos National Laboratory (LANL), Los Alamos, NM 87545, United States;

  Advanced Light Source (ALS), Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA 94720, United States;

  Advanced Light Source (ALS), Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA 94720, United States;

  Center for Integrated Nanotechnologies (CINT), Los Alamos National Laboratory (LANL), Los Alamos, NM 87545, United States,Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI 48109, United States;

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• 收录信息
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词

  Single crystal; Nanolayers; Incoherent interface; Pillar compression; Peak broadening; Dislocation saturation;

  机译：单晶;纳米层;接口不连贯;支柱压缩峰展宽;位错饱和;