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Fatigue behavior and damage characteristic of ultra-fine grain low-purity copper processed by equal-channel angular pressing (ECAP)

机译:等通道角挤压(ECAP)处理的超细晶粒低纯度铜的疲劳行为和损伤特性

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摘要

The S-N and Coffin-Manson plot, cyclic stress-strain response, changes of microstructure, and the surface morphology of ultra-fine grain (UFG) low-purity copper processed by ECAP were tested and observed in present study. And the formation mechanism of shear bands was discussed in detail. The results show that the UFG Cu represents longer lifetime under stress-controlled fatigue, but lower fatigue resistance under strain-controlled fatigue when compared with the coarse grain counterpart. Cyclic stress-strain responses of UFG Cu under stress-controlled fatigue alter from cyclic softening to cyclic hardening as stress amplitude decreases. But the responses always show cyclic softening under strain-controlled fatigue in present testing. By electron back scattering diffraction and transmission electron microscope technique, the shear bands were discovered on the surface of all cycled samples and no grain coarsening was discovered near the shear bands, which indicated that there was no inevitable relationship between formation of SBs and cyclic softening/grain coarsening. The discovery should be related to impurities in copper. The oriented distribution of defects along the shear plane in the last ECAP processing is one of the major mechanisms of SBs formation.
机译:在本研究中测试并观察了ECAP处理的超细晶粒(UFG)低纯度铜的S-N和Coffin-Manson图,循环应力-应变响应,微观结构变化以及表面形态。并详细讨论了剪切带的形成机理。结果表明,与粗晶粒相比,UFG Cu在应力控制疲劳下的寿命更长,而在应变控制疲劳下的疲劳强度更低。随着应力振幅的减小,UFG Cu在应力控制疲劳下的循环应力应变响应从循环软化变为循环硬化。但是,在当前测试中,响应始终显示出在应变控制疲劳下的周期性软化。通过电子反向散射衍射和透射电子显微镜技术,在所有循环样品的表面均发现了剪切带,并且在剪切带附近未发现晶粒粗化,这表明SB的形成与循环软化/无必然关系。晶粒粗化。该发现应与铜中的杂质有关。在最后的ECAP处理中,缺陷沿剪切面的定向分布是SBs形成的主要机制之一。

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