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首页> 外文期刊>Materials Science and Engineering >Thermally induced changes in thin gold films detected by polaritonic ellipsometry
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Thermally induced changes in thin gold films detected by polaritonic ellipsometry

机译：极化椭圆光度法检测金薄膜中的热诱导变化

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摘要

The effect of vacuum heat treatment in the range between 100 and 360 ℃ on the structure and optical properties of thermally evaporated thin gold films was studied. The structure of films was revealed by atomic force microscopy (AFM). optical characterization was performed using multiple-angle-of-incidence (MAI) reflectance ellipsometry at fixed wavelength (632.8 nm) in attenuated total reflection mode in contact with water. The observed temperature dependent non-monotonic modifications of optical constants of Au films were correlated with the evolution of both the film microstructure and film microrelief. This effect might be crucial in polaritonic optoelectronics and optochemical sensors.
机译：研究了100〜360℃真空热处理对热蒸发金薄膜结构和光学性能的影响。膜的结构通过原子力显微镜（AFM）揭示。光学表征是使用多入射角（MAI）反射椭圆率法在固定波长（632.8 nm）下与水接触的衰减全反射模式进行的。观察到的与温度有关的金膜光学常数的非单调变化与膜微结构和膜微浮雕的演变相关。在极化电光电子和光化学传感器中，这种效应可能至关重要。

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