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首页> 外文期刊>Materials Science and Engineering. A, Structural Materials >X-ray diffraction in amorphous microwires (Fe_(75.5)B_(13)Si_(11)Mo_(0.5)): influence of their geometry
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X-ray diffraction in amorphous microwires (Fe_(75.5)B_(13)Si_(11)Mo_(0.5)): influence of their geometry

机译：非晶微丝（Fe_（75.5）B_（13）Si_（11）Mo_（0.5）中的X射线衍射：几何形状的影响

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摘要

The microstructural characteristics of glass coated microwires, Fe_(75.5)B_(13)Si_(11)Mo_(0.5), are studied by wide angle X-ray scattering (WAXS) considering their geometry determined by their fabrication. The raw WAXS data show three wide diffraction peaks corresponding to different structural correlations, whose first and second ones correspond to long correlation distances in the Pyrex layer (≈3.5 A) and in the metallic core (≈2.0 A). The high q width peak (≈1.5 A) seems to be formed by an overlapping of two peaks associated to short correlation distances in the layer and in the core. The diffraction patterns normalized to absolute units show that the higher the ρ ratio the higher the intensity of the core peaks and the lower the intensity of the layer peaks. From the peaks corresponding to the metallic core, we can deduce small (although systematic) changes of the short-range order in the glassy metallic core of the microwires.
机译：考虑到其制造所决定的几何形状，通过广角X射线散射（WAXS）研究了玻璃涂层微线Fe_（75.5）B_（13）Si_（11）Mo_（0.5）的微观结构特征。原始的WAXS数据显示了三个对应于不同结构相关性的宽衍射峰，其第一和第二个衍射峰对应于Pyrex层（≈3.5A）和金属芯（≈2.0A）中的长相关距离。高q宽度峰（≈1.5A）似乎是由两个峰的重叠形成的，这两个峰与层和核中的短相关距离相关。归一化为绝对单位的衍射图谱显示，ρ比越高，芯峰的强度越高，层峰的强度越低。从金属芯对应的峰中，我们可以推断出微丝玻璃状金属芯中短程有序的小变化（尽管是系统的）。

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