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Microstructure, electrical properties and Hall coefficient of europium-doped Li-Ni ferrites

机译:euro掺杂Li-Ni铁氧体的微观结构,电性能和霍尔系数

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摘要

Europium-doped Li-Ni soft ferrites with the general formula of (Li_(0.5)Fe_(0.5))_(0.5) Ni_(0.5)Eu_yFe_(2-y)O_4 (where 0≤y ≤0.1), were prepared by using powder processing technique. The effect of Eu addition on the AC and DC electrical resistivity, Hall coefficient, charge mobility and charge carrier concentration of the prepared ferrites were characterized at room temperature. Seebeck coefficient was also calculated from the carrier concentration. Hall and Seebeck coefficients confirmed that all of the prepared samples are p-type semiconductors. The formation of the single-phase spinel ferrites structure was verified by X-ray diffraction. Lattice parameter, X-ray density, apparent density and A- and B-sites radii were calculated. The microstructure, which plays an important role in determining electrical properties, was analyzed by scanning electron microscopy and EDS, and found to have a major effect on the electrical properties. The dielectric loss was calculated from the AC conductivity and found to increase with firing temperature. This study provides information to optimize the composition and microstructure of the europium-doped Li-Ni ferrite with desired performance.
机译:制备通式为(Li_(0.5)Fe_(0.5))_(0.5)Ni_(0.5)Eu_yFe_(2-y)O_4(0≤y≤0.1)的Li掺杂Li-Ni软铁氧体使用粉末处理技术。在室温下表征了Eu添加对制备的铁氧体的AC和DC电阻率,霍尔系数,电荷迁移率和电荷载流子浓度的影响。塞贝克系数也由载流子浓度计算。霍尔和塞贝克系数证实,所有制备的样品均为p型半导体。通过X射线衍射验证了单相尖晶石铁素体结构的形成。计算出晶格参数,X射线密度,表观密度以及A和B位半径。通过扫描电子显微镜和EDS分析了在确定电性能中起重要作用的微观结构,发现其对电性能有重要影响。由AC电导率计算出介电损耗,发现其随烧成温度而增加。这项研究提供了信息,以优化具有所需性能的掺ped Li-Ni铁氧体的组成和微观结构。

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