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首页> 外文期刊>Materials Science and Engineering. B, Solid-State Materials for Advanced Technology >EBSD analysis of the growth of (001) magnetite thin films on MgO substrates
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EBSD analysis of the growth of (001) magnetite thin films on MgO substrates

机译:EBSD分析MgO衬底上(001)磁铁矿薄膜的生长

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Magnetite (Fe3O_4) thin films grown on (001) MgO substrates are analyzed by means of electron backscatter diffraction (EBSD) analysis. The EBSD technique enables the crystallographic orientation of individual grains to be determined with a high-spatial resolution up to 20 nm even on ceramic samples. The magnetite films are fully strained due to the lattice mismatch of MgO and Fe_3O_4. Upon annealing in air, the magnetic properties of the magnetite thin films were found to change considerably. Using the EBSD analysis, we find that most of the misorientation boundaries existing in the as-grown films are vanishing after the annealing step and the remaining misoriented grains form small islands with a size of about 100 nm. The size and distribution of these islands correspond well to the observations of antiferromagnetic pinning centers within the magnetic domain structures carried out by magnetic force microscopy on the same samples.
机译:通过电子背散射衍射(EBSD)分析了在(001)MgO衬底上生长的磁铁矿(Fe3O_4)薄膜。 EBSD技术甚至可以在陶瓷样品上以高达20 nm的高空间分辨率确定单个晶粒的晶体学取向。由于MgO和Fe_3O_4的晶格失配,磁铁矿膜完全应变。在空气中退火后,发现磁铁矿薄膜的磁性能发生很大变化。使用EBSD分析,我们发现在退火步骤之后,成膜后的薄膜中存在的大多数取向错误边界消失了,剩余的取向错误晶粒形成了大小约为100 nm的小岛。这些岛的大小和分布与通过磁力显微镜在相同样品上进行的磁畴结构内反铁磁钉扎中心的观察非常吻合。

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