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Transmission Kikuchi diffraction in a scanning electron microscope: A review

机译:扫描电子显微镜中的透射菊池衍射:综述

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摘要

Transmission Kikuchi diffraction (TKD), also known as transmission electron backscatter diffraction (t-EBSD), has received significant interest for the characterisation of nanocrystalline materials and nanostructures. In this paper, we will review the development of TKD, including forescatter detector imaging and ongoing parameter optimisation, as well as some of the current applications of the technique. A comparison to other microanalysis techniques is also included, highlighting their relative strengths and weaknesses and their complementarity with TKD. Finally, potential applications of the technique and possible future developments are discussed.
机译:透射菊池衍射(TKD),也称为透射电子背散射衍射(t-EBSD),对于表征纳米晶体材料和纳米结构引起了极大的兴趣。在本文中,我们将回顾TKD的发展,包括前散射检测器成像和正在进行的参数优化,以及该技术的一些当前应用。还包括与其他微量分析技术的比较,突出了它们的相对优缺点和与TKD的互补性。最后,讨论了该技术的潜在应用和可能的未来发展。

著录项

  • 来源
    《Materials Science & Engineering》 |2016年第12期|1-12|共12页
  • 作者单位

    School of Aerospace, Mechanical, Mechatronic Engineering, The University of Sydney, NSW 2006, Australia,Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia;

    Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia;

    School of Aerospace, Mechanical, Mechatronic Engineering, The University of Sydney, NSW 2006, Australia,Australian Centre for Microscopy and Microanalysis, The University of Sydney, NSW 2006, Australia;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    TKD; t-EBSD; Nanocrystalline; Nanomaterials; Corrosion; Highly deformed materials;

    机译:TKD;EBSD;纳米晶纳米材料腐蚀;高度变形的材料;

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