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Entropy Based Test Point Evaluation and Selection Method for Analog Circuit Fault Diagnosis

机译：基于熵的模拟电路故障诊断测试点评估与选择方法

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摘要

By simplifying tolerance problem and treating faulty voltages on different test points as independent variables, integer-coded table technique is proposed to simplify the test point selection process. Usually, simplifying tolerance problem may induce a wrong solution while the independence assumption will result in over conservative result. To address these problems, the tolerance problem is thoroughly considered in this paper, and dependency relationship between different test points is considered at the same time. A heuristic graph search method is proposed to facilitate the test point selection process. First, the information theoretic concept of entropy is used to evaluate the optimality of test point. The entropy is calculated by using the ambiguous sets and faulty voltage distribution, determined by component tolerance. Second, the selected optimal test point is used to expand current graph node by using dependence relationship between the test point and graph node. Simulated results indicate that the proposed method more accurately finds the optimal set of test points than other methods; therefore, it is a good solution to minimize the size of the test point set. To simplify and clarify the proposed method, only catastrophic and some specific parametric faults are discussed in this paper.
机译：通过简化容差问题并将不同测试点上的故障电压视为独立变量，提出了整数编码表技术来简化测试点选择过程。通常，简化容差问题可能会导致错误的解决方案，而独立性假设将导致过于保守的结果。为了解决这些问题，本文充分考虑了公差问题，同时考虑了不同测试点之间的依赖关系。提出了一种启发式图搜索方法，以方便测试点选择过程。首先，熵的信息理论概念被用来评估测试点的最优性。通过使用模棱两可的集合和错误的电压分布（由组件公差确定）来计算熵。其次，通过利用测试点和图节点之间的依赖关系，将选定的最佳测试点用于扩展当前图节点。仿真结果表明，与其他方法相比，该方法可以更准确地找到最佳的测试点集。因此，将测试点集的大小最小化是一个很好的解决方案。为了简化和阐明该方法，本文仅讨论了灾难性故障和某些特定的参数故障。

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  • 来源
    《Mathematical Problems in Engineering》 |2014年第3期|259430.1-259430.16|共16页
  • 作者

    Yuan Gao; Chenglin Yang; Shulin Tian; Fang Chen;

  • 作者单位

    School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, Sichuan 611731, China;

    School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, Sichuan 611731, China;

    School of Automation Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, Sichuan 611731, China;

    Chengdu College of UESTC, Chengdu, Sichuan 611731, China;

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