...
  • 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>Mechanical systems and signal processing >Stochastic inverse thermographic characterization of sub-pixel sized through cracks
【24h】

Stochastic inverse thermographic characterization of sub-pixel sized through cracks

机译：通过裂缝确定亚像素大小的随机逆热像图特征

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

The present paper descnbes an approach tor inferring the presence and nature of tiny flaws in thin metallic panel components. The flaws are selected to be reminiscent of nascent-stage through cracks that might appear in the thin aluminum skins of aircraft, for instance.A laser heating source is used in conjunction with a low cost microbolometer-based digital 1R imaging system in order that image processing might be applied to uncover promising locations to examine further, for the possible occurrence of tiny flaws. These local regions are subsequently considered during the solution of a stochastic inverse problem; aimed at inferring the existence and character of these "unseen" flaws that fit within an individual pixel associated the imaging field of view. The study is computational; employing surrogate experimental data.
机译：本文提出了一种推断薄金属面板组件中微小缺陷的存在和性质的方法。例如，选择缺陷的目的是使人联想起通过飞机薄铝表皮可能出现的裂纹的初期阶段。激光加热源与低成本的基于微辐射热计的数字1R成像系统结合使用，以使图像成像处理过程可能会被用于发现有希望的位置，以便进一步检查是否可能出现微小缺陷。随后在求解随机逆问题时会考虑这些局部区域。目的在于推断这些“看不见的”缺陷的存在和特征，这些缺陷适合与成像视野相关的单个像素。研究是计算的；使用替代实验数据。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号