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首页> 外文期刊>Mechatronics, IEEE/ASME Transactions on >Nanorobotic Strategies for Handling and Characterization of Metal-Assisted Etched Silicon Nanowires
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Nanorobotic Strategies for Handling and Characterization of Metal-Assisted Etched Silicon Nanowires

机译:用于金属辅助刻蚀硅纳米线的处理和表征的纳米机器人策略

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摘要

This paper gives insight into nanorobotic handling and electrical characterization of silicon nanowires (SiNWs) inside a scanning electron microscope. The synthesis of metal-assisted etched both end doped SiNWs is presented. Several nanorobotic pick and place strategies for handling individual nanowires are discussed. Key approaches such as force-based and adhesive bonding (focus ion and electron beam induced deposition) have been realized experimentally and evaluated toward their suitability for automation. Preliminary results on electrical characterization are presented.
机译:本文深入介绍了扫描电子显微镜内硅纳米线(SiNWs)的纳米机器人处理和电特性。介绍了金属辅助蚀刻的两端掺杂SiNW的合成。讨论了几种处理单个纳米线的纳米机器人拾取和放置策略。已经通过实验实现了诸如基于力和粘合剂结合(聚焦离子和电子束诱导沉积)等关键方法,并对其自动化性进行了评估。提出了有关电特性的初步结果。

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