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Characterization of surface properties of ordered nanostructures using SEM stereoscopic technique

机译:使用SEM立体技术表征有序纳米结构的表面特性

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摘要

In this paper, a low-cost and high-throughput method for fabrication of large area ordered nanostructure is presented and the obtained structures are characterized using SEM stereoscopic technique for 3D-reconstruction of nanostructures to calculate the surface properties. The results show two kinds of deformations, including narrow waves of the surface, due to the embedment of nanospheres to the photoresist and irregular ups and downs in surface structure, which could be caused by fabrication process faults. This approach provides a simple and efficient way to measure the morphological parameters in flat nanometre-sized structures.
机译:本文提出了一种低成本,高通量的大面积有序纳米结构的制备方法,并利用SEM立体技术对所得结构进行了表征,以对纳米结构进行3D重建以计算表面性能。结果表明,由于纳米球嵌入光致抗蚀剂中以及表面结构的不规则起伏是由于制造工艺缺陷引起的,这两种变形包括表面窄波。这种方法提供了一种简单有效的方法来测量扁平纳米级结构中的形态参数。

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