Foreword to the special issue on 20th IEEE international symposium on design and diagnostics of electronic circuits and systems (DDECS2017)

Stamenkovic Zoran; Novak Ondrej; Pleskacz Witold

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Foreword to the special issue on 20th IEEE international symposium on design and diagnostics of electronic circuits and systems (DDECS2017)

机译：第20届IEEE电子电路和系统的设计和诊断国际研讨会（DDECS2017）上的特刊的序言

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来源
《Microelectronics & Reliability》 |2018年第2期|287-287|共1页
作者
Stamenkovic Zoran; Novak Ondrej; Pleskacz Witold;
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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);
原文格式 PDF
正文语种 eng
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Foreword to the special issue on 20th IEEE international symposium on design and diagnostics of electronic circuits and systems (DDECS2017)

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