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A multi-scale approach of the thermo-mechanical properties of silica-filled epoxies used in electronic packaging

机译:用于电子包装的二氧化硅填充环氧树脂的热机械性能的多尺度方法

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摘要

Delamination of mating interfaces can cause serious reliability problems in different application areas. The causes of delamination are multiple. In the case of leadframe-based chip packages, a critical interface is that between the leadframe and the moulding compound. Delamination can magnify stress levels at the interface and can lead to fatigue of interconnects. The objective of this study is to evaluate the influence of different causes of delamination on degradation of the leadframe-compound interface by means of simulation, supported by targeted experiments. Up to now two models have been devised, which show good convergence. However the simulations are not yet compatible and need to be validated.
机译:配合接口的分层会在不同的应用领域引起严重的可靠性问题。分层的原因是多种的。对于基于引线框的芯片封装,关键的接口是引线框与模塑料之间的接口。分层会放大界面处的应力水平,并可能导致互连的疲劳。这项研究的目的是通过有针对性的实验支持的模拟,评估分层的不同原因对引线框-化合物界面降解的影响。到目前为止,已经设计了两个模型,它们显示出良好的收敛性。但是,仿真尚不兼容,需要进行验证。

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  • 来源
    《Microelectronics & Reliability》 |2012年第7期|p.1300-1305|共6页
  • 作者单位

    TNO, De Rondom 1,5612 AP Eindhoven, The Netherlands;

    Wroclaw University of Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland;

    Wroclaw University of Technology, Janiszewskiego 11/17, 50-372 Wroclaw, Poland;

    TNO, De Rondom 1,5612 AP Eindhoven, The Netherlands;

    TNO, De Rondom 1,5612 AP Eindhoven, The Netherlands;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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