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Reliability evaluation for single event crosstalk via probabilistic transfer matrix

机译：通过概率转移矩阵对单事件串扰进行可靠性评估

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摘要

To quantitatively analyze the influence on integrated circuits (ICs) by crosstalk and single event effects, the reliability of ICs under these effects was evaluated via probabilistic transfer matrix (PTM). The basic theory of PTM was briefly introduced. By modifying the right probability of gates in PTM, the influence from single event effect on the reliability was obtained. By considering the error probability of signal transportation through interconnects, the reliability under crosstalk was calculated. The results show that crosstalk and single event effects will both decrease the reliability of ICs. The farther from the output the gate is suffered from single event effect, the less significant influences on the reliability decreased. The crosstalk effects will bring worse influences on the reliability than single event effects. The technologies for improving reliability of ICs should take more attentions to the crosstalk effects and multi-single event effects.
机译：为了定量分析串扰和单事件效应对集成电路（IC）的影响，通过概率转移矩阵（PTM）评估了在这些效应下IC的可靠性。简要介绍了PTM的基本原理。通过修改PTM中门的正确概率，获得了单事件效应对可靠性的影响。通过考虑信号通过互连传输的错误概率，可以计算出串扰下的可靠性。结果表明，串扰和单事件效应都会降低IC的可靠性。栅极受到单事件效应的影响离输出越远，对可靠性降低的影响就越小。串扰效应对可靠性的影响比单事件效应更严重。提高IC可靠性的技术应更加关注串扰效应和多单事件效应。

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  • 来源
    《Microelectronics & Reliability》 |2012年第7期|p.1511-1514|共4页
  • 作者

    Baojun Liu; Li Cai; Peng Bai; Weidong Peng;

  • 作者单位

    Science Institute, Air Force Engineering University, Xi'An 710051, China;

    Science Institute, Air Force Engineering University, Xi'An 710051, China;

    Synthetic Electronic Information System Research Department, Air Force Engineering University, Xi'An 710051, China;

    Synthetic Electronic Information System Research Department, Air Force Engineering University, Xi'An 710051, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
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