A novel power-clamp assisted complementary MOSFET for robust ESD protection

著录项

• 来源
  《Microelectronics & Reliability》 |2012年第8期|p.1593-1597|共5页
• 作者

  Jian Wu; Shurong Dong; Mingliang Li; Meng Miao; Fei Ma; Jianfeng Zheng; Yan Han;

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• 作者单位

  ESD Lab, Department of Information Science and Electronics Engineering, Zhejiang University, Hangzhou, China;

  ESD Lab, Department of Information Science and Electronics Engineering, Zhejiang University, Hangzhou, China;

  ESD Lab, Department of Information Science and Electronics Engineering, Zhejiang University, Hangzhou, China;

  ESD Lab, Department of Information Science and Electronics Engineering, Zhejiang University, Hangzhou, China;

  ESD Lab, Department of Information Science and Electronics Engineering, Zhejiang University, Hangzhou, China;

  ESD Lab, Department of Information Science and Electronics Engineering, Zhejiang University, Hangzhou, China;

  ESD Lab, Department of Information Science and Electronics Engineering, Zhejiang University, Hangzhou, China;

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• 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
• 原文格式 PDF
• 正文语种 eng
• 中图分类
• 关键词