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首页> 外文期刊>Microelectronics & Reliability >Testing process performance based on the yield: an application to the liquid-crystal display module
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Testing process performance based on the yield: an application to the liquid-crystal display module

机译：基于产量的过程性能测试：在液晶显示模块中的应用

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摘要

Process capability indices have been introduced to provide numerical measures on whether a manufacturing process is capable of reproducing items meeting the specifications predetermined by the product designers or the consumers. Process yield is one of the most common criteria used in the manufacturing industry for measuring process perfor- mance. The formula S_(pk) has been proposed to calculate the process yield for normal processes. The formula S_(pk) provides an exact measure on the process yield. Unfortunately, the statistical properties of the estimated S-circurnflex _(pk) are mathematically intractable. In this paper, we apply the bootstrap simulation method to construct the lower confidence bound of S_(pk). We then present a real-world application to the liquid-crystal display module process, to illustrate how we may apply the formula S_(pk) to actual data collected from the factories.
机译：已经引入了过程能力指数，以提供有关制造过程是否能够复制满足产品设计者或消费者预定规格的产品的数值度量。工艺产量是制造业中用于衡量工艺性能的最常见标准之一。已提出公式S_（pk）以计算正常过程的过程产量。公式S_（pk）提供了对过程成品率的精确度量。不幸的是，估计的S-圆周屈曲_（pk）的统计特性在数学上是棘手的。在本文中，我们应用自举模拟方法构造S_（pk）的下置信界。然后，我们将实际应用程序应用于液晶显示模块过程，以说明如何将公式S_（pk）应用于从工厂收集的实际数据。

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