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首页> 外文期刊>Microwaves, Antennas & Propagation, IET >Microwave and millimetre wave antipodal Vivaldi antenna with trapezoid-shaped dielectric lens for imaging of construction materials
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Microwave and millimetre wave antipodal Vivaldi antenna with trapezoid-shaped dielectric lens for imaging of construction materials

机译：具有梯形介电透镜的微波和毫米波对映维瓦尔第天线，用于建筑材料成像

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摘要

High-quality microwave and millimetre wave imaging of construction materials and structures requires ultra-wideband (UWB) techniques to provide high-range resolution as well as a reasonable penetration depth. A modified compact microwave and millimetre wave UWB antipodal Vivaldi antenna is designed and presented in this study. First, the conventional antipodal Vivaldi antenna is designed as a reference antenna. Then, to provide the desired frequency range (3.4–40 GHz) with increased gain at its lower frequencies, the slit edge technique is applied, thus creating a periodic slit edge antipodal Vivaldi antenna (PSEAVA). Finally, a trapezoid-shaped dielectric lens (TDL) as an extension of the substrate is added and optimised to increase gain and directivity at higher frequencies of the frequency range, creating PSEAVA with a TDL (PSEAVA-TDL). The results show that the PSEAVA-TDL has the highest gain (up to 16 dB) and front-to-back ratio (up to 37.5 dB), and the narrowest half power beamwidth (down to 11.7°). A prototype of the proposed PSEAVA-TDL with compact size of 40 × 90 × 0.508 mm is fabricated and applied for the imaging of samples made of construction materials. High-range resolution images of the samples are obtained with this antenna by using synthetic aperture radar algorithm.
机译：建筑材料和结构的高质量微波和毫米波成像需要超宽带（UWB）技术，以提供高范围分辨率和合理的穿透深度。本研究设计并提出了一种改进的紧凑型微波毫米波超宽带对极维瓦尔第天线。首先，将传统的对立维瓦尔第天线设计为参考天线。然后，为了提供所需的频率范围（3.4–40 GHz），并在其较低频率处增加增益，应用了切缝边缘技术，从而创建了周期性的切缝边缘对立维瓦尔第天线（PSEAVA）。最后，添加并优化了梯形介电透镜（TDL）作为基板的延伸，以增加频率范围内较高频率下的增益和方向性，从而创建了具有TDL（PSEAVA-TDL）的PSEAVA。结果表明，PSEAVA-TDL具有最高的增益（最高16 dB）和前后比（最高37.5 dB），以及最窄的半功率波束宽度（最低11.7°）。所提出的PSEAVA-TDL的原型尺寸为40×90×0.508 mm，已被制造出来，并用于建筑材料样品的成像。通过使用合成孔径雷达算法，使用该天线可获得样品的高分辨率图像。

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