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Dependence of the critical temperature in overdoped copper oxides on superfluid density

机译：过量掺杂的氧化铜中的临界温度与超流体密度的关系

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摘要

The physics of underdoped copper oxide superconductors, including the pseudogap, spin and charge ordering and their relation to superconductivity(1-3), is intensely debated. The overdoped copper oxides are perceived as simpler, with strongly correlated fermion physics evolving smoothly into the conventional Bardeen-Cooper-Schrieffer behaviour. Pioneering studies on a few overdoped samples(4-11) indicated that the superfluid density was much lower than expected, but this was attributed to pair-breaking, disorder and phase separation. Here we report the way in which the magnetic penetration depth and the phase stiffness depend on temperature and doping by investigating the entire overdoped side of the La2-xSrxCuO4 phase diagram. We measured the absolute values of the magnetic penetration depth and the phase stiffness to an accuracy of one per cent in thousands of samples; the large statistics reveal clear trends and intrinsic properties. The films are homogeneous; variations in the critical superconducting temperature within a film are very small (less than one kelvin). At every level of doping the phase stiffness decreases linearly with temperature. The dependence of the zero-temperature phase stiffness on the critical superconducting temperature is generally linear, but with an offset; however, close to the origin this dependence becomes parabolic. This scaling law is incompatible with the standard Bardeen-Cooper-Schrieffer description.
机译：掺杂不足的氧化铜超导体的物理性质，包括拟间隙，自旋和电荷有序化及其与超导性的关系（1-3）引起了激烈的争论。过度掺杂的氧化铜被认为更简单，具有强相关性的费米子物理学逐渐发展为常规的Bardeen-Cooper-Schrieffer行为。对一些超掺杂样品的开创性研究（4-11）表明，超流体密度远低于预期，但这归因于成对断裂，无序和相分离。在这里，我们通过研究La2-xSrxCuO4相图的整个超掺杂侧面来报告磁通深度和相刚度取决于温度和掺杂的方式。我们测量了数千个样品中的磁穿透深度和相刚度的绝对值，其准确性为1％。大量的统计数据显示出清晰的趋势和内在属性。薄膜是均质的。薄膜内的临界超导温度变化很小（小于一个开尔文）。在每个掺杂水平，相刚度都随温度线性降低。零温度相刚度对临界超导温度的依赖关系通常是线性的，但存在偏差。但是，在接近原点的情况下，这种依赖性变成抛物线。此缩放定律与标准Bardeen-Cooper-Schrieffer描述不兼容。

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  • 来源
    《Nature》 |2016年第7616期|309-311|共3页
  • 作者

    Bozovic I.; He X.; Wu J.; Bollinger A. T.;

  • 作者单位

    Brookhaven Natl Lab, Upton, NY 11973 USA|Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA;

    Brookhaven Natl Lab, Upton, NY 11973 USA|Yale Univ, Dept Appl Phys, New Haven, CT 06520 USA;

    Brookhaven Natl Lab, Upton, NY 11973 USA;

    Brookhaven Natl Lab, Upton, NY 11973 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
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