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An open-ended substrate integrated waveguide probe for detection and sizing of surface cracks in metals

机译:一种开放式基片集成波导探头,用于检测和确定金属表面的裂纹

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摘要

This paper describes the development of a novel microwave probe system for detection and sizing of surface cracks in metals. The probe, which is based on the substrate integrated waveguide (SIW) technology, consists of five parts, namely, a microwave oscillator, an envelope detector, a microstrip line, a transition section, and an open-ended SIW. To evaluate the performance of the probe, theoretical and experimental results are presented for the scans of two metallic specimens containing long surface cracks. It is shown that the SIW probe is capable of detecting and sizing surface cracks of a few millimeters deep while being relatively compact and light as compared to the conventional open-ended rectangular waveguide probes.
机译:本文介绍了一种新型的微波探针系统的开发,该系统可检测和确定金属表面的裂纹。该探头基于衬底集成波导(SIW)技术,由五个部分组成,即微波振荡器,包络检测器,微带线,过渡部分和开放式SIW。为了评估探头的性能,给出了扫描两个包含长表面裂纹的金属样品的理论和实验结果。结果表明,与传统的开放式矩形波导探针相比,SIW探针能够检测和确定几毫米深的表面裂纹,同时相对紧凑和轻便。

著录项

  • 来源
    《NDT & E international》 |2013年第1期|36-38|共3页
  • 作者单位

    Civil Aviation Technology College, Meraj Ave., Tehran 13878, Iran;

    Department of Electrical Engineering, Amirkabir University of Technology, Tehran 15914, Iran;

    Department of Electrical Engineering, Amirkabir University of Technology, Tehran 15914, Iran;

    Department of Electrical Engineering, Amirkabir University of Technology, Tehran 15914, Iran;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    microwave; waveguide; cracks; sizing;

    机译:微波;波导;裂缝浆纱;

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