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Depth prediction of non-air interface defect using pulsed thermography

机译：脉冲热成像技术在非空界面缺陷深度预测中的应用

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摘要

Prediction of defect depth has been an important quantitative application of pulsed thermography and several methods have been reported in the literature. However, all those methods consider only the situation where the interface between sample and defect is sample-air. In this paper, using an analysis based on a theoretical one-dimensional solution of pulsed thermography, we analyzed the depth predicting principle and procedure of four representative methods for non-air interface situation. The numerical simulations were compared with experimental results of one steel sample milled with eight flat-bottom holes, and each hole was filled with different materials to simulate different non-air interfaces. The comparison shows that the peak contrast time method is badly affected by the defect interface; however, other three methods are not affected.
机译：缺陷深度的预测一直是脉冲热成像技术的重要定量应用，文献中已经报道了几种方法。但是，所有这些方法仅考虑样品与缺陷之间的界面为样品空气的情况。本文采用基于脉冲热成像理论一维解的分析方法，分析了非空界面情况下四种代表方法的深度预测原理和程序。将数值模拟与一个铣削了八个平底孔的钢样品的实验结果进行了比较，每个孔填充了不同的材料以模拟不同的非空气界面。比较表明，缺陷界面对峰对比时间方法的影响很大。但是，其他三种方法不受影响。

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  • 来源
    《NDT & E international》 |2012年第2012期|p.39-45|共7页
  • 作者

    Zhi Zeng; Chunguang Li; Ning Tao; Lichun Feng; Cunlin Zhang;

  • 作者单位

    Beijing Key Laboratory for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Department of Physics, Capital Normal University, Beijing 100048, China,Institute of Physics and Electronic Engineering, Chongqing Normal University, #12 Tianchen Road, Chongqing 400047, China,Chongqing Normal University, Institute of Physics and Electronic Engineering, #12 Tianchen Road, Chongqing 400047, China;

    China Acadamy of Civil Aviation Science and Technology, Beijing 100028, China;

    Beijing Key Laboratory for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Department of Physics, Capital Normal University, Beijing 100048, China;

    Beijing Key Laboratory for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Department of Physics, Capital Normal University, Beijing 100048, China;

    Beijing Key Laboratory for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics, Ministry of Education, Department of Physics, Capital Normal University, Beijing 100048, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    defect depth; pulsed thermography; steel; flat-bottom hole; non-air interface;

    机译：缺陷深度脉冲热成像钢;平底孔;非空中接口;

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