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Load-differential imaging for detection and localization of fatigue cracks using Lamb waves

机译：使用兰姆波的载荷微分成像用于疲劳裂纹的检测和定位

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摘要

Fatigue cracks are common and potentially critical defects in metallic plate-like structures, and ultrasonic guided wave methods provide an efficient and relatively low-cost means of crack detection and monitoring. However, widely used baseline subtraction methods may fail under mismatched environmental and operational conditions. In particular, varying applied loads change not only the contact state of a crack but also specimen dimensions and wave speeds, which affect the ultrasonic signal response. The load dependence of crack opening provides a possibility for enhanced crack detection, which is well-known for higher frequency bulk waves. A load-differential method is proposed in this paper whereby guided wave signals obtained at different loads under the same damage state are compared without utilizing previously recorded damage-free data. To demonstrate this method, a fatigue test was performed on an aluminum plate specimen instrumented with a sparse array of piezoelectric transducers. Signal changes due to crack opening effects caused by increasing tensile loads are visualized using delay-and-sum imaging. The results show that the load-differential method is capable of detecting cracks and visualizing their locations.
机译：疲劳裂纹是金属板状结构中常见的潜在缺陷，而超声波导波方法则提供了一种有效且成本较低的裂纹检测和监测方法。但是，在不匹配的环境和操作条件下，广泛使用的基线减法可能会失败。特别是，变化的施加载荷不仅会改变裂纹的接触状态，还会改变样本尺寸和波速，从而影响超声信号响应。裂纹开口的载荷依赖性为增强裂纹检测提供了可能性，这对于高频体波是众所周知的。本文提出了一种载荷微分方法，该方法可以比较在相同损伤状态下不同载荷下获得的导波信号，而无需利用先前记录的无损伤数据。为了演示该方法，对装有压电换能器稀疏阵列的铝板样本进行了疲劳测试。使用延迟总和成像可以观察到由于拉伸载荷增加而导致的因裂纹张开效应而引起的信号变化。结果表明，载荷微分方法能够检测裂纹并可视化裂纹的位置。

著录项

  • 来源
    《NDT & E international》 |2012年第2012期|p.142-149|共8页
  • 作者

    Xin Chen; Jennifer E. Michaels; Sangjun Lee; Thomas E. Michaels;

  • 作者单位

    Georgia Institute of Technology, School of Electronical & Computer Engineering, Atlanta, GA 30332-0250, United States;

    Georgia Institute of Technology, School of Electronical & Computer Engineering, Atlanta, GA 30332-0250, United States;

    Acellent Technologies, Inc., Sunnyvale, CA 94085, United States;

    Georgia Institute of Technology, School of Electronical & Computer Engineering, Atlanta, GA 30332-0250, United States;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    guided wave; sparse array; load-differential imaging; crack detection;

    机译：导波稀疏数组负载差分成像;探伤;

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