• 主题
高级搜索  >
历史搜索 清空历史
首页> 外文期刊>NDT & E international >A capacitive probe for quantitative nondestructive evaluation of wiring insulation
【24h】

A capacitive probe for quantitative nondestructive evaluation of wiring insulation

机译：电容式探头，用于定量评估接线绝缘性

获取原文
获取原文并翻译 | 示例
           
页面导航
  • 摘要
  • 著录项
  • 相似文献
  • 相关主题

摘要

A capacitive probe has been developed for quantitative evaluation of wiring insulation permittivity. The probe consists of two patch electrodes that conform to the curvature of the wire under test. A numerical model is utilized for inverse determination of insulation complex permittivity from measured probe response. Experimental studies on thermally and hydrolytically degraded wire samples show that the resulting permittivity change of the insulation is successfully detected using the described capacitive probe, for the wire type MIL-W-81381/12, which is predominantly Kapton" coated. Changes in the permittivity of the wiring insulation, detected by the capacitive probe, are shown to be in accordance with the results of research conducted previously on Kapton" film samples degraded by thermal and hydrolytic exposure. Thus, the feasibility of assessing wiring insulation degradation status by quantitative capacitive techniques is demonstrated, which is of particular interest to the aerospace industry.
机译：已经开发出一种电容式探针，用于定量评估布线绝缘介电常数。探针由两个贴片电极组成，这些电极与被测导线的曲率相符。数值模型用于根据测得的探头响应来逆确定绝缘复介电常数。对热降解和水解降解的电线样品进行的实验研究表明，对于MIL-W-81381 / 12型电线（主要是Kapton涂层），使用上述电容式探头可以成功检测到绝缘体的介电常数变化。电容式探头检测到的布线绝缘层的厚度显示与先前对因热和水解暴露而降解的Kapton薄膜样品进行的研究结果一致。因此，证明了通过定量电容技术评估布线绝缘劣化状态的可行性，这对于航空航天工业特别重要。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱：kefu@zhangqiaokeyan.com

京公网安备：11010802029741号 ICP备案号：京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有

  • 客服微信

  • 服务号